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Film Thickness

Film Thickness measuring systems fully automated and semi automated; spectral reflectometry in combination with microscopes offering robust thin-film measuring data from 50nm to 20 micron layers. Even multi-layer stacks up to 10 layers can be measured.
Schichtdickenmesssystem voll- und halbautomatisch, Spektralreflektometrie in Kombination mit Mikroskopen liefert zuverlässige Dünnfilm Messdaten von 50 nm bis 20 Mikrometer Schichten. Sogar vielschichtige Stacks bis zu 10 Schichten können gemessen werden.
3 Produkte in Film Thickness 
Automatic Thin film Measurement station - measuring and mapping system with microscope and robot wafer handling
Vollautomatische MessStation, Schichtdicken Messung, Wafer Mapping 3D. Schichten...
MCS-TF automatic Thinfilm measurement and mapping system with microscope, robot wafer-handling option
Vollautomatische Schichtdicken Messung. Leistungsfähiges Mapping System....
Thin Film Measurement system Nanocalc based on spectral reflectometry available for nearly all microscope types
Mikroskopische Dünnschichtmessung Nanocalc Schichtdickenmesssystem, spektrale...
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