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Infrared Metrology

Infrared Microscopes for measuring tasks.
CD and Overlay measurement, combinations with film thickness measuring
and confocal or scanning white light interference
5 Produkte in Infrared Metrology 
       
Infrared Microscopy for e.g. adjustment or front/rear side alignment on Si-Wafers
We customize IR microscopes depending on your requirements. Please contact...
INM100/INM200 Infrared Configuration
INM200 automated microscope for measurement and inspection tasks. Laser...
Art.No.:IR_mikroskop
Art.No.:INMseries
Details
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INM200 multi spectral configuration with colour camera, infrared- and UV-camera
measuring and inspection microscope with advanced imaging features (prices...
Leica DMRM with Infrared Transmitted Light
with powerful NIR condenser
Infrarotmikroskopie mit Hochleistungs...

Art.No.:INM200UV-C
Art.No.:500016_Inf
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No img.
we design and produce customized rear inspection systems to suit your ...
Art.No.:rear_side_insp
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