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Refurbished systems

4 Produkte in Refurbished systems 
       
CD & Overlay Measurement fully automated based on high performance microscope INM200
CD Mess- System Vermessung von Linienbreiten (critical dimensions ) und...
Leitz MPV SP Thin Film Measurement System for transparent layers, spare parts, repair and service
Leitz Schichtdickenmesssystem MPV-SP für transparente Schichten, Leitz...
Art.No.:INM200UV CD
Art.No.:Leitz_MPV-2
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Microscope Ergoplan for Measuring and Inspection Tasks, all Functions Motorized/Controllable
Leica Leitz Ergoplan Halbleiter Inspektionsmikroskop, Gebrauchtgerät in...
Zeiss Axiotron with Scanning Stage
inspection microscope for wafers
Inspektionsmikroskop für Halbleiter

Art.No.:Ergoplan
Art.No.:ZeissAxio
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