Products Microscopy & Software

Lab & Measuring Microscopes

Softwarecontrolled Microscope Systems

Applications

Critical dimension (CD)

Defect inspection

3D surface measurement

Solutions by products

MCS Metrology

5 Produkte in MCS Metrology

MCS CD imaging software for Critical Dimension, Linewidth and Overlay Measurement; Overlay und Strukturbreitenmessung

MCS CD imaging software for Critical Dimension, Linewidth and Overlay Measurement; Overlay und Strukturbreitenmessung

special imaging software for automatic microscopic structure width measuring,...

Art.No.:

MCS-CD

Price on request

MCS Confocal, software 3D Metrology in nanometer range with light microscope

MCS Confocal, software 3D Metrology in nanometer range with light microscope

Fast measuring of topography for structures as small as a few nanometers...

Art.No.:

MCS-Confocal

Price on request

MCS Depth From Focus, tiefenscharfe Bilder, fokus stacking

MCS Depth From Focus, tiefenscharfe Bilder, fokus stacking

one image with depth of focus out of a stack of individual pictures aus...

Art.No.:

MCS-DFF

Price on request

MCS Thin Film Measurement, Schichtdickenmessung

MCS Thin Film Measurement, Schichtdickenmessung

software for automated thin film measurement Leistungsfähige, modulare Software...

Art.No.:

MCS-TF

Price on request

White Light Interferometry, Weißlichtinterferometrie

software for fast, reliable tool for contact-free determination of 3-D topographies...

Art.No.:

MCS-WLI

Price on request

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