Products Microscopy & Software 
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MCS Inspection

Microscopic optical inspection: on wafers, reticles, substrates
optical-visual control after AQL (Acceptance Quality Level) criteria
Mikroskopisch optische Inspektion von Wafern, Lithografie-Masken und anderen Substraten
optisch-visuelle Kontrolle nach AQL (acceptance quality level) Kriterien
 
 
5 Produkte in MCS Inspection 
   
MCS-IS microscopic Wafer Inspection
software-supported, microscope inspection of wafers and frames ...
Art.No.:MCS-IS
Details
 
 
   
Defect Review for wafer based on imported defect files DIV
Defect Review for wafer based on imported defect files
Defect Review software, defect engineering and microscope inspection feature...
Art.No.:MCS RV
Details
 
 
   
Infrared microscopy software for advanced semiconductor applications, IR camera range up to 1700 nm
spezielle IR Features mit Mess- und Komfortfunktionen wie Kontrastverbesserung,...
Art.No.:MCS-IR
Details
 
 
   
MCS Automatische Optische Inspektion
aktive Fehlersuche, verbesserte Bildaufnahme und flexible Bildverarbeitung
Art.No.:MCS-AOI
Details
 
 
   
MCS-INK
MCS INK software works with software-controlled microscopes for virtual...
Art.No.:MCS-INK
Details